Measurement of surface waviness with a mechatronic profilograph 

Alena A. Fedorova, Assistant of the sub-department mechanical engineering technology, Chuvash State University named after I. N. Ulyanov (15 Moskovskiy avenue, Cheboksary, Russia), E-mail: e_a_a@mail.ru
Sergey A. Vasil'ev, Doctor of engineering sciences, associate professor, head of the sub-department applied mechanics and graphics, Chuvash State University named after I. N. Ulyanov (15 Moskovskiy avenue, Cheboksary, Russia), E-mail: Vsa_21@mail.ru 

531.717.81

10.21685/2072-3059-2021-4-7 

Background. Determination of various surfaces’ waviness is an important factor in assessing the quality of the objects under study. The subject of the research is the process of measuring the waviness of various surfaces. The purpose of this work is to calculate the waviness parameters by a laser sensor by the circular scanning method to increase the efficiency of studying various surfaces. Materials and methods. To measure the roughness of the soil surface profile, it is proposed to use the method of circular scanning with a mechatronic profilograph. The article provides a scheme for scanning the profile of waviness, determining the direction of the profile and parameters of the height and step of waviness of surfaces. Results. The measurement of the waviness parameters was carried out by the method of circular scanning with a mechatronic profilograph, in the educational laboratory of the Mechanical Engineering Faculty of the Chuvash State University named after I. N. Ulyanov. The graphs of measuring the parameters of the deflection of a metal sheet in polar coordinates and in the form of a sweep were obtained, the parameters of the height and step of the waviness of the surface of the metal sheet were determined. Conclusions. In a scientific article, it was found that to determine the roughness of the soil to use the circular method of laser scanning, as well as to automate the measurement process to increase the measurement speed. 

surface waviness, waviness step and height, circular scanning, laser profilograph 

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